Our Patented Product
FR1000 Smart Nano Semiconductor Characterization System
Based on the patent technology, our product, FR1000, empowers scientists with the ability to conduct in-situ physical properties measurement for nanomaterials. The measuring processes on-site as they are occurring and under changing external stimuli is the paramount goal of in-situ technique with real-time response to the users. Moreover, multiple process can be done within one workstation so that the physical transfer of the sample from one instrument to another can be avoided. The material scope that can be investigated is largely broadened to include materials that are easily oxidized upon air exposure.
Products & Services
What We Provide
- Standard products
- Customized solution
- Vacuum system design
- Calibration & maintenance
- Pilot research